WEKO3
アイテム
{"_buckets": {"deposit": "f8597936-0c01-45bc-8dd4-43d808c62dee"}, "_deposit": {"created_by": 2, "id": "14073", "owners": [2], "pid": {"revision_id": 0, "type": "depid", "value": "14073"}, "status": "published"}, "_oai": {"id": "oai:nagasaki-u.repo.nii.ac.jp:00014073", "sets": ["21"]}, "author_link": ["50515"], "item_2_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2010-08", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "1", "bibliographicPageEnd": "S28", "bibliographicPageStart": "S23", "bibliographicVolumeNumber": "59", "bibliographic_titles": [{"bibliographic_title": "Journal of Electron Microscopy"}]}]}, "item_2_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "In a Bloch-wave-based STEM image simulation, a framework for calculating the cross section for any incoherent scattering process was formulated by Allen et al. [(2003) Lattice-resolution contrast from a focused coherent electron probe. Part I. Ultramicroscopy 96: 47-63; Part II. ibid. 96: 65-81]. They simulated the high-angle annular dark-field, back-scattered electron, electron energy-loss spectroscopy and energy-dispersive X-ray (EDX) STEM images from the inelastic scattering coefficients. Furthermore, a skilful approach for deriving the excitation amplitude and block diagonalization in the eigenvalue equation was employed to reduce computing time and memory. In the present work, I extended their scheme to a layer-by-layer representation for application to inhomogeneous crystals. Calculations for a multi-layer Si sample including a displaced layer were performed by multiplying Allen et al.\u0027s block-diagonalized matrices. Electron intensities within the sample and EDX STEM images were calculated at various conditions. From the calculations, three-dimensional STEM analysis was considered.", "subitem_description_type": "Abstract"}]}, "item_2_description_63": {"attribute_name": "引用", "attribute_value_mlt": [{"subitem_description": "Journal of Electron Microscopy, 59(1), pp.S23-S28; 2010", "subitem_description_type": "Other"}]}, "item_2_relation_11": {"attribute_name": "PubMed番号", "attribute_value_mlt": [{"subitem_relation_type": "isVersionOf", "subitem_relation_type_id": {"subitem_relation_type_id_text": "20573745", "subitem_relation_type_select": "PMID"}}]}, "item_2_relation_12": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type": "isVersionOf", "subitem_relation_type_id": {"subitem_relation_type_id_text": "10.1093/jmicro/dfq028", "subitem_relation_type_select": "DOI"}}]}, "item_2_rights_13": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "© The Author 2010. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oxfordjournals.org"}, {"subitem_rights": "This is a pre-copy-editing, author-produced PDF of an article accepted for publication in Journal of electron microscopy following peer review. The definitive publisher-authenticated version Journal of electron microscopy, 59(1), pp.S23-S28; 2010 is available online at: http://jmicro.oxfordjournals.org/content/59/S1/S23."}]}, "item_2_source_id_10": {"attribute_name": "書誌レコードID", "attribute_value_mlt": [{"subitem_source_identifier": "AA00697060", "subitem_source_identifier_type": "NCID"}]}, "item_2_source_id_7": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "00220744", "subitem_source_identifier_type": "ISSN"}]}, "item_2_source_id_8": {"attribute_name": "EISSN", "attribute_value_mlt": [{"subitem_source_identifier": "14779986", "subitem_source_identifier_type": "ISSN"}]}, "item_2_version_type_16": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_ab4af688f83e57aa", "subitem_version_type": "AM"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Morimura, Takao"}], "nameIdentifiers": [{"nameIdentifier": "50515", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2020-12-22"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "JEM59_S23.pdf", "filesize": [{"value": "1.1 MB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 1100000.0, "url": {"label": "JEM59_S23.pdf", "url": "https://nagasaki-u.repo.nii.ac.jp/record/14073/files/JEM59_S23.pdf"}, "version_id": "729ab757-6b42-4e4a-89dc-4be130eaa069"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "Bethe equation", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Bloch-wave method", "subitem_subject_scheme": "Other"}, {"subitem_subject": "EDX", "subitem_subject_scheme": "Other"}, {"subitem_subject": "inelastic electron scattering", "subitem_subject_scheme": "Other"}, {"subitem_subject": "layer-by-layer", "subitem_subject_scheme": "Other"}, {"subitem_subject": "STEM", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "STEM image simulation by Bloch-wave method with layer-by-layer representation.", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "STEM image simulation by Bloch-wave method with layer-by-layer representation."}]}, "item_type_id": "2", "owner": "2", "path": ["21"], "permalink_uri": "http://hdl.handle.net/10069/25636", "pubdate": {"attribute_name": "公開日", "attribute_value": "2011-09-01"}, "publish_date": "2011-09-01", "publish_status": "0", "recid": "14073", "relation": {}, "relation_version_is_last": true, "title": ["STEM image simulation by Bloch-wave method with layer-by-layer representation."], "weko_shared_id": 2}
STEM image simulation by Bloch-wave method with layer-by-layer representation.
http://hdl.handle.net/10069/25636
http://hdl.handle.net/10069/256368778307c-b437-42ee-87c3-745933132143
名前 / ファイル | ライセンス | アクション |
---|---|---|
JEM59_S23.pdf (1.1 MB)
|
|
Item type | 学術雑誌論文 / Journal Article(1) | |||||
---|---|---|---|---|---|---|
公開日 | 2011-09-01 | |||||
タイトル | ||||||
タイトル | STEM image simulation by Bloch-wave method with layer-by-layer representation. | |||||
言語 | ||||||
言語 | eng | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | Bethe equation | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | Bloch-wave method | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | EDX | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | inelastic electron scattering | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | layer-by-layer | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | STEM | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
著者 |
Morimura, Takao
× Morimura, Takao |
|||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | In a Bloch-wave-based STEM image simulation, a framework for calculating the cross section for any incoherent scattering process was formulated by Allen et al. [(2003) Lattice-resolution contrast from a focused coherent electron probe. Part I. Ultramicroscopy 96: 47-63; Part II. ibid. 96: 65-81]. They simulated the high-angle annular dark-field, back-scattered electron, electron energy-loss spectroscopy and energy-dispersive X-ray (EDX) STEM images from the inelastic scattering coefficients. Furthermore, a skilful approach for deriving the excitation amplitude and block diagonalization in the eigenvalue equation was employed to reduce computing time and memory. In the present work, I extended their scheme to a layer-by-layer representation for application to inhomogeneous crystals. Calculations for a multi-layer Si sample including a displaced layer were performed by multiplying Allen et al.'s block-diagonalized matrices. Electron intensities within the sample and EDX STEM images were calculated at various conditions. From the calculations, three-dimensional STEM analysis was considered. | |||||
書誌情報 |
Journal of Electron Microscopy 巻 59, 号 1, p. S23-S28, 発行日 2010-08 |
|||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 00220744 | |||||
EISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 14779986 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA00697060 | |||||
PubMed番号 | ||||||
関連タイプ | isVersionOf | |||||
識別子タイプ | PMID | |||||
関連識別子 | 20573745 | |||||
DOI | ||||||
関連タイプ | isVersionOf | |||||
識別子タイプ | DOI | |||||
関連識別子 | 10.1093/jmicro/dfq028 | |||||
権利 | ||||||
権利情報 | © The Author 2010. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oxfordjournals.org | |||||
権利 | ||||||
権利情報 | This is a pre-copy-editing, author-produced PDF of an article accepted for publication in Journal of electron microscopy following peer review. The definitive publisher-authenticated version Journal of electron microscopy, 59(1), pp.S23-S28; 2010 is available online at: http://jmicro.oxfordjournals.org/content/59/S1/S23. | |||||
著者版フラグ | ||||||
出版タイプ | AM | |||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||
引用 | ||||||
内容記述タイプ | Other | |||||
内容記述 | Journal of Electron Microscopy, 59(1), pp.S23-S28; 2010 |