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II-VI族化合物結晶の電顕試料作製法
http://hdl.handle.net/10069/16564
http://hdl.handle.net/10069/1656429773340-839a-4ac8-a1c9-be356507feb7
名前 / ファイル | ライセンス | アクション |
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kyoyoS25_01_02_t.pdf (13.7 MB)
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Item type | 紀要論文 / Departmental Bulletin Paper(1) | |||||
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公開日 | 2008-04-14 | |||||
タイトル | ||||||
タイトル | II-VI族化合物結晶の電顕試料作製法 | |||||
言語 | ||||||
言語 | jpn | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | departmental bulletin paper | |||||
著者 |
岩永, 浩
× 岩永, 浩× 柴田, 昇 |
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著者別名 | ||||||
姓名 | Iwanaga, H. | |||||
著者別名 | ||||||
姓名 | Shibata, N. | |||||
その他のタイトル | ||||||
その他のタイトル | Procedures of Producing II-VI Compound Specimens for HVEM Observation | |||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | In order to observe dislocation loops, stacking faults and radiation damages in II-VI compounds such as ZnO, ZnS, CdS, CdSe, CdTe, under a high-voltage electron microscope, thin films of these crystals were prepared by chemical etching, cleavage and ion bonbardment. In addition, as-grown crystals which are thin enough for electron microscopic observations were employed as specimens without any procedures. Characteristics of these procedures and some examples of the observations are described. | |||||
書誌情報 |
長崎大学教養部紀要. 自然科学篇 巻 25, 号 1, p. 13-23, 発行日 1984-07 |
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ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 02871319 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AN10352293 | |||||
著者版フラグ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
sortkey | ||||||
P00013-P00023 | ||||||
引用 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 長崎大学教養部紀要. 自然科学篇. 1984, 25(1), p.13-23 |