{"created":"2023-05-15T16:37:41.780296+00:00","id":11103,"links":{},"metadata":{"_buckets":{"deposit":"5e44f055-4771-4016-be54-bf249eb6d936"},"_deposit":{"created_by":2,"id":"11103","owners":[2],"pid":{"revision_id":0,"type":"depid","value":"11103"},"status":"published"},"_oai":{"id":"oai:nagasaki-u.repo.nii.ac.jp:00011103","sets":["14:15:16:864"]},"author_link":["43243","43244"],"item_3_alternative_title_19":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"Simulation of Scanning transmission electron microscope image by Bloch-wave method"}]},"item_3_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2012-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"78","bibliographicPageEnd":"22","bibliographicPageStart":"16","bibliographicVolumeNumber":"42","bibliographic_titles":[{"bibliographic_title":"長崎大学大学院工学研究科研究報告"},{"bibliographic_title":"Reports of Graduate School of Engineering, Nagasaki University","bibliographic_titleLang":"en"}]}]},"item_3_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"In a Bloch-wave-based scanning transmission electron microscope (STEM) image simulation, a framework for calculating the cross section for any incoherent scattering process was formulated by Allen et al. They simulated the HAADF, BSE, EELS and EDX STEM images from the inelastic scattering coefficients. Furthermore, a skilful approach for deriving the excitation amplitude and block diagonalization in the eigenvalue equation were employed to reduce the computing time and memory. In the present work, we extend their scheme to a layer-by-layer representation for application to inhomogeneous crystals that include precipitates and atomic displacement. Calculations for a multi-layer of Si-Sb-Si were performed by multiplying Allen et al.’s block-diagonalized matrices. Electron intensities within the sample and EDX STEM images were calculated at various conditions. From the calculations, 3-dimensional STEM analysis was considered.","subitem_description_type":"Abstract"}]},"item_3_description_64":{"attribute_name":"引用","attribute_value_mlt":[{"subitem_description":"長崎大学大学院工学研究科研究報告, 42(78), pp.16-22; 2012","subitem_description_type":"Other"}]},"item_3_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"43244","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Morimura, Takao"}]}]},"item_3_publisher_33":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"長崎大学大学院工学研究科"}]},"item_3_source_id_10":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA12601998","subitem_source_identifier_type":"NCID"}]},"item_3_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"18805574","subitem_source_identifier_type":"ISSN"}]},"item_3_text_62":{"attribute_name":"sortkey","attribute_value_mlt":[{"subitem_text_value":"3"}]},"item_3_text_63":{"attribute_name":"出版者別言語","attribute_value_mlt":[{"subitem_text_value":"Graduate School of Engineering, Nagasaki University"}]},"item_3_version_type_16":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"森村, 隆夫"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-12-22"}],"displaytype":"detail","filename":"42_78_16.pdf","filesize":[{"value":"5.6 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"42_78_16.pdf","url":"https://nagasaki-u.repo.nii.ac.jp/record/11103/files/42_78_16.pdf"},"version_id":"9fbb7dd8-557a-413d-80db-46f5348bf658"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Bloch wave method","subitem_subject_scheme":"Other"},{"subitem_subject":"STEM","subitem_subject_scheme":"Other"},{"subitem_subject":"Bethe equation","subitem_subject_scheme":"Other"},{"subitem_subject":"EDX","subitem_subject_scheme":"Other"},{"subitem_subject":"HAADF","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"行列表示によるＳＴＥＭ像シミュレーション法の開発","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"行列表示によるＳＴＥＭ像シミュレーション法の開発"}]},"item_type_id":"3","owner":"2","path":["864"],"pubdate":{"attribute_name":"公開日","attribute_value":"2012-01-30"},"publish_date":"2012-01-30","publish_status":"0","recid":"11103","relation_version_is_last":true,"title":["行列表示によるＳＴＥＭ像シミュレーション法の開発"],"weko_creator_id":"2","weko_shared_id":-1},"updated":"2023-05-16T01:19:43.494084+00:00"}