{"created":"2023-05-15T16:39:59.386523+00:00","id":14072,"links":{},"metadata":{"_buckets":{"deposit":"c91ab345-12fe-4512-8545-2cba9d2dcdd7"},"_deposit":{"created_by":2,"id":"14072","owners":[2],"pid":{"revision_id":0,"type":"depid","value":"14072"},"status":"published"},"_oai":{"id":"oai:nagasaki-u.repo.nii.ac.jp:00014072","sets":["175:315"]},"author_link":["50512","50513","50514"],"item_2_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2008-10","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"8","bibliographicPageEnd":"888","bibliographicPageStart":"886","bibliographicVolumeNumber":"59","bibliographic_titles":[{"bibliographic_title":"Scripta Materialia"}]}]},"item_2_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The high-performance thermoelectric compound Ti0.5(Zr0.5Hf0.5)0.5NiSn0.998Sb0.002 with half-Heusler lattice was studied by X-ray diffraction (XRD) and transmission electron microscopy (TEM). Each half-Heusler peak in the XRD pattern was accompanied by a bump at the high-angle side. Granular domains, a few nanometers in size, were observed in a bright-field TEM image. Fourier transformation and inverse Fourier transformation of the high-resolution TEM image revealed that the granular structure consists of half-Heusler domains with ordering and with disordering between second nearest neighbor atoms.","subitem_description_type":"Abstract"}]},"item_2_description_63":{"attribute_name":"引用","attribute_value_mlt":[{"subitem_description":"Scripta Materialia, 59(8), pp.886-888; 2008","subitem_description_type":"Other"}]},"item_2_publisher_33":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Elsevier BV"}]},"item_2_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1016/j.scriptamat.2008.06.039","subitem_relation_type_select":"DOI"}}]},"item_2_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright © 2008 Acta Materialia Inc. Published by Elsevier Ltd. on behalf of Acta Materialia Inc."}]},"item_2_source_id_10":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11067905","subitem_source_identifier_type":"NCID"}]},"item_2_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"13596462","subitem_source_identifier_type":"ISSN"}]},"item_2_version_type_16":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Morimura, Takao"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hasaka, Masayuki"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kondo, Shin-ichiro"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-12-22"}],"displaytype":"detail","filename":"ScrMat59_886.pdf","filesize":[{"value":"2.1 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"ScrMat59_886.pdf","url":"https://nagasaki-u.repo.nii.ac.jp/record/14072/files/ScrMat59_886.pdf"},"version_id":"09ddf68d-5fd9-4000-aad0-90ef56fba5b1"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Half-Heusler phase","subitem_subject_scheme":"Other"},{"subitem_subject":"High-resolution electron microscopy","subitem_subject_scheme":"Other"},{"subitem_subject":"Melt spinning","subitem_subject_scheme":"Other"},{"subitem_subject":"Thermoelectric material","subitem_subject_scheme":"Other"},{"subitem_subject":"X-ray diffraction","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Transmission electron microscopy observation of the half-Heusler compound Ti0.5(Zr0.5Hf0.5)0.5NiSn0.998Sb0.002","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Transmission electron microscopy observation of the half-Heusler compound Ti0.5(Zr0.5Hf0.5)0.5NiSn0.998Sb0.002"}]},"item_type_id":"2","owner":"2","path":["315"],"pubdate":{"attribute_name":"公開日","attribute_value":"2010-10-01"},"publish_date":"2010-10-01","publish_status":"0","recid":"14072","relation_version_is_last":true,"title":["Transmission electron microscopy observation of the half-Heusler compound Ti0.5(Zr0.5Hf0.5)0.5NiSn0.998Sb0.002"],"weko_creator_id":"2","weko_shared_id":2},"updated":"2023-05-15T18:51:14.225635+00:00"}