{"created":"2023-05-15T16:41:42.339368+00:00","id":16427,"links":{},"metadata":{"_buckets":{"deposit":"0ce3c174-47d5-460b-a7d2-7fae062f9a61"},"_deposit":{"created_by":2,"id":"16427","owners":[2],"pid":{"revision_id":0,"type":"depid","value":"16427"},"status":"published"},"_oai":{"id":"oai:nagasaki-u.repo.nii.ac.jp:00016427","sets":["14:21"]},"author_link":["62264","62265"],"item_2_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2009-08","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"9","bibliographicPageEnd":"1209","bibliographicPageStart":"1203","bibliographicVolumeNumber":"109","bibliographic_titles":[{"bibliographic_title":"Ultramicroscopy"}]}]},"item_2_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"In a dynamical STEM image simulation by the Bloch-wave method, Allen et al. formulated a framework for calculating the cross-section for any incoherent scattering process from the inelastic scattering coefficients: thermal diffuse scattering (TDS) for high-angle annular dark-field (HAADF) and back-scattered electron (BSE) STEM, and ionization for electron energy-loss spectroscopy (EELS) and energy-dispersive X-ray spectroscopy (EDX) STEM. Furthermore, their method employed a skillfull approach for deriving the excitation amplitude and block diagonalization in the eigenvalue equation. In the present work, we extend their scheme to a layer-by-layer representation for application to inhomogeneous crystals that include precipitates, defects and atomic displacement. Calculations for a multi-layer sample of Si-Sb-Si were performed by multiplying Allen et al.'s block-diagonalized matrices. Electron intensities within the sample and EDX STEM images, as an example of the inelastic scattering, were calculated at various conditions. From the calculations, 3-dimensional STEM analysis was considered.","subitem_description_type":"Abstract"}]},"item_2_description_63":{"attribute_name":"引用","attribute_value_mlt":[{"subitem_description":"Ultramicroscopy, 109(9), pp.1203-1209; 2009","subitem_description_type":"Other"}]},"item_2_publisher_33":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Elsevier B.V."}]},"item_2_relation_11":{"attribute_name":"PubMed番号","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"19525067","subitem_relation_type_select":"PMID"}}]},"item_2_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1016/j.ultramic.2009.05.007","subitem_relation_type_select":"DOI"}}]},"item_2_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright c 2009 Elsevier B.V. All rights reserved."}]},"item_2_source_id_10":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00876310","subitem_source_identifier_type":"NCID"}]},"item_2_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"03043991","subitem_source_identifier_type":"ISSN"}]},"item_2_source_id_8":{"attribute_name":"EISSN","attribute_value_mlt":[{"subitem_source_identifier":"1879-2723","subitem_source_identifier_type":"ISSN"}]},"item_2_version_type_16":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Morimura, Takao"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hasaka, Masayuki"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-12-23"}],"displaytype":"detail","filename":"Ult109_1203.pdf","filesize":[{"value":"4.3 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"Ult109_1203.pdf","url":"https://nagasaki-u.repo.nii.ac.jp/record/16427/files/Ult109_1203.pdf"},"version_id":"adaa5391-a289-4d60-90f2-8e0d41d6fd16"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Bloch wave method","subitem_subject_scheme":"Other"},{"subitem_subject":"EDX","subitem_subject_scheme":"Other"},{"subitem_subject":"HAADF","subitem_subject_scheme":"Other"},{"subitem_subject":"Inelastic electron scattering","subitem_subject_scheme":"Other"},{"subitem_subject":"Layer-by-layer","subitem_subject_scheme":"Other"},{"subitem_subject":"STEM","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Bloch-wave-based STEM image simulation with layer-by-layer representation.","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Bloch-wave-based STEM image simulation with layer-by-layer representation."}]},"item_type_id":"2","owner":"2","path":["21"],"pubdate":{"attribute_name":"公開日","attribute_value":"2009-10-30"},"publish_date":"2009-10-30","publish_status":"0","recid":"16427","relation_version_is_last":true,"title":["Bloch-wave-based STEM image simulation with layer-by-layer representation."],"weko_creator_id":"2","weko_shared_id":2},"updated":"2023-05-15T18:59:02.194171+00:00"}