{"created":"2023-05-15T16:43:08.551993+00:00","id":18371,"links":{},"metadata":{"_buckets":{"deposit":"c7cc1ef9-8f3d-4b06-a43a-6ddd7c6e51bb"},"_deposit":{"created_by":2,"id":"18371","owners":[2],"pid":{"revision_id":0,"type":"depid","value":"18371"},"status":"published"},"_oai":{"id":"oai:nagasaki-u.repo.nii.ac.jp:00018371","sets":["14:65"]},"author_link":["73377","73378"],"item_9_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2006-07","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"4762","bibliographicPageStart":"4759","bibliographic_titles":[{"bibliographic_title":"IEEE Antennas and Propagation Society International Symposium 2006"}]}]},"item_9_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The dead zone of RFID system has been numerically and experimentally investigated. The electric field distribution near the square conducting plate was numerically obtained when the plane wave is incident. The current distribution on the conducting plate in the case of spherical wave incidence is expressed by the integration of induced current due to the plane wave incidence. The scattered electric field was calculated and discussed. The electric field distribution near the conducting plate was measured and the existence of the dead zone was shown","subitem_description_type":"Abstract"}]},"item_9_description_40":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"text","subitem_description_type":"Other"}]},"item_9_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"IEEE Antennas and Propagation Society International Symposium 2006, Albuquerque, NM, 9-14 July 2006.","subitem_description_type":"Other"}]},"item_9_description_63":{"attribute_name":"引用","attribute_value_mlt":[{"subitem_description":"Proc. of 2006 IEEE Antennas and Propagation Society International Symposium, Albuquerque, 558.8, pp.4759-4762, July 2006.","subitem_description_type":"Other"}]},"item_9_publisher_33":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_9_relation_10":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"BA81268069","subitem_relation_type_select":"NCID"}}]},"item_9_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1109/APS.2006.1711704","subitem_relation_type_select":"DOI"}}]},"item_9_relation_9":{"attribute_name":"ISBN","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"1424401224","subitem_relation_type_select":"ISBN"}},{"subitem_relation_type_id":{"subitem_relation_type_id_text":"1424401232","subitem_relation_type_select":"ISBN"}}]},"item_9_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"(c)2006 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE."}]},"item_9_version_type_16":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Taguchi, Mitsuo"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Mizuno, Hiroyuki"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-12-23"}],"displaytype":"detail","filename":"200607AP-S(2).pdf","filesize":[{"value":"672.7 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"200607AP-S(2).pdf","url":"https://nagasaki-u.repo.nii.ac.jp/record/18371/files/200607AP-S(2).pdf"},"version_id":"62792651-52e4-413f-a496-b9809575ac8a"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Analysis of Dead Zone of RFID System","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Analysis of Dead Zone of RFID System"}]},"item_type_id":"9","owner":"2","path":["65"],"pubdate":{"attribute_name":"公開日","attribute_value":"2008-11-14"},"publish_date":"2008-11-14","publish_status":"0","recid":"18371","relation_version_is_last":true,"title":["Analysis of Dead Zone of RFID System"],"weko_creator_id":"2","weko_shared_id":-1},"updated":"2023-05-16T03:58:34.013990+00:00"}