@article{oai:nagasaki-u.repo.nii.ac.jp:00020618,
 author = {岩永, 浩 and 望月, 勝美 and 冨塚, 明 and 柴田, 昇},
 issue = {1},
 journal = {長崎大学教養部紀要. 自然科学篇},
 month = {Jul},
 note = {Two types of rectangular etch pits were developed on the {100} surfaces of CdTe, HgSe and HgTe crystals using a suitable etchant. Type-I etch pits were produced only in CdTe crystals and have facets composed of four {111}_B Type-II etch pits appeared in HgSe and HgTe crystals and have facets composed of two {111}_A and two {111}_B From the facet structure of the pit on the {100} surface, polarity of these crystals can easily be identified when they have no polar {111} surface ; the 〈111〉_A direction of these crystals makes an angle of 55° with the normal of the {100} surface in a plane containing both the long side of the rectangular etch pit and the normal of the {100} surface., 長崎大学教養部紀要. 自然科学篇. 1985, 26(1), p.33-42},
 pages = {33--42},
 title = {CdTe, HgSe, HgTe 結晶 {100} 面上のエッチ・ピットと極性の判定},
 volume = {26},
 year = {1985}
}