{"created":"2023-05-15T16:33:32.702711+00:00","id":5817,"links":{},"metadata":{"_buckets":{"deposit":"cbe07de9-a001-414c-8c64-45535cf8ca54"},"_deposit":{"created_by":2,"id":"5817","owners":[2],"pid":{"revision_id":0,"type":"depid","value":"5817"},"status":"published"},"_oai":{"id":"oai:nagasaki-u.repo.nii.ac.jp:00005817","sets":["14:65"]},"author_link":["24924","24925"],"item_9_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2014-09-18","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"668","bibliographicPageStart":"667","bibliographic_titles":[{"bibliographic_title":"Antennas and Propagation Society International Symposium (APSURSI), 2014 IEEE"}]}]},"item_9_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A novel gradient-based inverse scattering method for imaging inhomogeneous objects from time-domain data of only total electric field is presented. Unlike most inverse scattering methods, the proposed method does not require the explicit information of the incident field illuminating a region of interest. Numerical simulations demonstrate the effectiveness of the method.","subitem_description_type":"Abstract"}]},"item_9_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"2014 IEEE Antennas and Propagation Society International Symposium, APSURSI 2014; Memphis Convention CenterMemphis; United States; 6 July 2014 through 11 July 2014","subitem_description_type":"Other"}]},"item_9_description_63":{"attribute_name":"引用","attribute_value_mlt":[{"subitem_description":"Antennas and Propagation Society International Symposium (APSURSI), 2014 IEEE, pp.667-668; 2014","subitem_description_type":"Other"}]},"item_9_publisher_33":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_9_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1109/APS.2014.6904664","subitem_relation_type_select":"DOI"}}]},"item_9_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"c 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_9_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"15223965","subitem_source_identifier_type":"ISSN"}]},"item_9_version_type_16":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Takenaka, Takashi"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Moriyama, Toshifumi"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-12-21"}],"displaytype":"detail","filename":"APSURSI2014_6904664.pdf","filesize":[{"value":"124.4 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"APSURSI2014_6904664.pdf","url":"https://nagasaki-u.repo.nii.ac.jp/record/5817/files/APSURSI2014_6904664.pdf"},"version_id":"562a5ff6-b41f-4775-9d1e-cf39960db777"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Microwave imaging from total electric field data","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Microwave imaging from total electric field data"}]},"item_type_id":"9","owner":"2","path":["65"],"pubdate":{"attribute_name":"公開日","attribute_value":"2014-11-25"},"publish_date":"2014-11-25","publish_status":"0","recid":"5817","relation_version_is_last":true,"title":["Microwave imaging from total electric field data"],"weko_creator_id":"2","weko_shared_id":-1},"updated":"2023-05-16T02:58:36.549471+00:00"}