@article{oai:nagasaki-u.repo.nii.ac.jp:00006071,
 author = {Kubo, Ikumaro and Tomiyama, Noriyuki},
 journal = {長崎大学教育学部自然科学研究報告, Science bulletin of the Faculty of Education, Nagasaki University},
 month = {Feb},
 note = {Etch pattern on surfaces of ZnO crystal has been observed by using an E.M. and an S.E.M. Two kinds of boundaries on which stacking orders of Zn and O atomic planes change have been developed on the plane {1010} by using etching technique. Hydrofluoric acid (～46%) was used as etchant. One boundary on which stacking of Zn and O planes changes from one order, -O.Zn-O.Zn-, to the other order, -Zn.O-Zn.O-, is a twin boundary. While, the other boundary on which stacking of Zn and O planes changes from the latter order to the former one is not considered as a twin one. Results of observation suggest to us that the decrease in the growth rate of the crystal needle is due to the generation of twin boundaries in the crystal., 長崎大学教育学部自然科学研究報告. vol.24, p.13-21; 1973},
 pages = {13--21},
 title = {Inversion boundaries developed by etching on{1010} of ZnO crystal},
 volume = {24},
 year = {1973}
}