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Bloch-wave-based STEM image simulation with layer-by-layer representation.
http://hdl.handle.net/10069/22304
http://hdl.handle.net/10069/22304950e98ac-0a47-40e5-943b-fc37fbdc2ab0
名前 / ファイル | ライセンス | アクション |
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Ult109_1203.pdf (4.3 MB)
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2009-10-30 | |||||
タイトル | ||||||
タイトル | Bloch-wave-based STEM image simulation with layer-by-layer representation. | |||||
言語 | ||||||
言語 | eng | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | Bloch wave method | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | EDX | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | HAADF | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | Inelastic electron scattering | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | Layer-by-layer | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | STEM | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
著者 |
Morimura, Takao
× Morimura, Takao× Hasaka, Masayuki |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | In a dynamical STEM image simulation by the Bloch-wave method, Allen et al. formulated a framework for calculating the cross-section for any incoherent scattering process from the inelastic scattering coefficients: thermal diffuse scattering (TDS) for high-angle annular dark-field (HAADF) and back-scattered electron (BSE) STEM, and ionization for electron energy-loss spectroscopy (EELS) and energy-dispersive X-ray spectroscopy (EDX) STEM. Furthermore, their method employed a skillfull approach for deriving the excitation amplitude and block diagonalization in the eigenvalue equation. In the present work, we extend their scheme to a layer-by-layer representation for application to inhomogeneous crystals that include precipitates, defects and atomic displacement. Calculations for a multi-layer sample of Si-Sb-Si were performed by multiplying Allen et al.'s block-diagonalized matrices. Electron intensities within the sample and EDX STEM images, as an example of the inelastic scattering, were calculated at various conditions. From the calculations, 3-dimensional STEM analysis was considered. | |||||
書誌情報 |
Ultramicroscopy 巻 109, 号 9, p. 1203-1209, 発行日 2009-08 |
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出版者 | ||||||
出版者 | Elsevier B.V. | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 03043991 | |||||
EISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 1879-2723 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA00876310 | |||||
PubMed番号 | ||||||
関連タイプ | isVersionOf | |||||
識別子タイプ | PMID | |||||
関連識別子 | 19525067 | |||||
DOI | ||||||
関連タイプ | isVersionOf | |||||
識別子タイプ | DOI | |||||
関連識別子 | 10.1016/j.ultramic.2009.05.007 | |||||
権利 | ||||||
権利情報 | Copyright c 2009 Elsevier B.V. All rights reserved. | |||||
著者版フラグ | ||||||
出版タイプ | AM | |||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||
引用 | ||||||
内容記述タイプ | Other | |||||
内容記述 | Ultramicroscopy, 109(9), pp.1203-1209; 2009 |